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# 1.19 NVMCTRL ECC Testing

This example application demonstrates how to test the NVMCTRL ECC feature on internal Flash and Data Flash memories.

## Description

This example uses the NVMCTRL peripheral library to test its ECC with Fault Injection feature. This application write 64-bit data in Flash and Data Flash for single-error injection, and 64-bit data in Flash for double-error injection to highlights SEC and DED process.

## Downloading and Building the Application

To clone or download this application from Github, go to the main page of this repository and then click Clone button to clone this repository or download as zip file. This content can also be downloaded using content manager by following these instructions.

Path of the application within the repository is apps/nvmctrl/nvmctrl_ecc_testing/firmware.

To build the application, refer to the following table and open the project using its IDE.

Project Name | Description
--- | ---
pic32cm_jh01_curiosity_pro.X | MPLABX project for PIC32CM JH01 Curiosity Pro Evaluation Kit

## Setting Up the Hardware

The following table shows the target hardware for the application projects.

Project Name | Board
--- | ---
pic32cm_jh01_curiosity_pro.X | PIC32CM JH01 Curiosity Pro Evaluation Kit

### Setting Up PIC32CM JH01 Curiosity Pro Evaluation Kit

- Connect the Debug USB port on the board to the computer using a micro USB cable

## Running the Application

1. Build and Program the application using its IDE
2. Menu is displayed with following choices
   - ‘a’: Single Fault Injection is chosen and following message is displayed on console:
   - ‘b’: Double Fault Injection is chosen and following message is displayed on console: