Reliability

The ATECC608A-TNGLoRaWAN is fabricated with Microchip’s high reliability CMOS EEPROM manufacturing technology.

Table 1. EEPROM Reliability
Parameter Min. Typ. Max. Units
Write Endurance at +85°C (Each Byte) 400,000 Write Cycles
Data Retention at +55°C 10 Years
Data Retention at +35°C 30 50 Years
Read Endurance Unlimited Read Cycles