Radiated Emissions

Depending on the application and its environment, the use of a driven shield may cause excessive radio frequency emissions. This is caused by high-speed switching of large-area electrodes and can lead to products failing to meet the required RFI standards.

High emissions are particularly prevalent not at the switching frequency of the touch sensors but higher frequencies dependent on the MCU core speed and the I/O pin slew rate.

Radiation Mitigation

The following describes design techniques that will reduce radiation from the shield.

Figure 1. Minimum Driven Shield Area