Below is an overview of event related features for peripherals in the
tinyAVR®
1-Series, which are useful for developing core
independent applications. Refer to the specific device data sheet for detailed
information.
- PORT - I/O Pin Controller
- Generate events from all
GPIO pins
- TCA - 16-bit Timer/Counter Type
A
- Count positive edges of
event signal
- Count both edges of event
signal
- Count prescaled clock
cycles as long as the event signal is high
- Count prescaled clock
cycles. Event signal controls the count direction.
- Output events can be
generated based on counter overflow, underflow, and compare match
- TCB - 16-bit Timer/Counter Type
B
- Initialization, counting,
and capture can be controlled by event signal
- For modes that generate
output, the output can be distributed as an event signal
- TCD - 12-bit Timer/Counter Type
D
- Output events can be
generated based on counter compare match
- Output events can be
delayed by a configurable number of TCD delay clock cycles. The TCD
delay clock is a prescaled version of the TCD clock.
- Counter operation can be
controlled in a number of different ways by two individual event input
signals
- Possibility of masking
and filtering input events
- USART - Universal Synchronous and
Asynchronous Receiver and Transmitter
- Input event signal can be
used as receiver input instead of the corresponding RX pin
- RTC - Real Time Counter
- Output events can be
generated on counter overflow and compare match
- Output events can be
generated periodically corresponding to each nth RTC clock
period, where n is selectable from a predefined set of values
- CCL - Configurable Custom
Logic
- Each Lookup table (LUT)
can take two individual events as inputs for its corresponding truth
table
- The output from each LUT
can be distributed as event signals
- AC - Analog Comparator
- Comparator output can be
distributed as an event signal
- ADC - Analog-to-Digital
Converter
- Input event can trigger
an ADC conversion
- UPDI - Unified Program and Debug
Interface
- Generates an output event
that can be used to measure the system clock frequency