Factory Test Mode Access Lock

The factory test mode allows in-depth testing of the device by Microchip for failure analysis. The factory test mode access can be disabled using a lock bit protected by UPK1. If you wish Microchip to perform failure analysis on a given device, enable the factory test mode access with UPK1. The factory test mode access can also be permanently disabled by the user. When that is done, no future failure analysis is possible on that device.

In the Configure Security Wizard, click Microsemi factory access to lock the factory test mode access, as shown in the following figure. To permanently disable factory test mode access, use the Configure OTP Security tool.

Figure 1. Microsemi Factory Access Page in Configure Security Wizard