This application note explains various ADC (Analog to Digital Converter) characterization parameters given in the datasheets and how they effect ADC measurements. It also describes how to measure these parameters during application testing in production and how to perform run-time compensation for some of the measured deviations.
A great advantage with the Flash memory of the Atmel® AVR® is that calibration code can be replaced with application code after characterization. Therefore, no code space is consumed by calibration code in the final product.