1 Introduction

The aging process of semiconductors strongly depends on the junction temperature and voltage at which devices are operated. As per Arrhenius’ Law, higher temperatures or higher VDDs exponentially decrease a device’s lifetime.

The lifetime estimates presented in this application note are extrapolated from high temperature and VDD tests performed on SAMA7G5/D6 Series devices. Those tests are also known as HTOL (High Temperature Operating Life) tests.