4.2 Reliability

The SHA106 is fabricated with Microchip’s high-reliability CMOS EEPROM manufacturing technology.

Table 4-1. EEPROM Reliability
Parameter Min Typ. Max. Units
Data Retention at +55°C >40 Years
Read Endurance Unlimited Read Cycles
Note:
  1. The number of times that an EEPROM cell would be written is expected to be minimal for most use cases. Maximum EEPROM write cycles are expected to occur when the monotonic counter is used, which can be incremented up to 10,000 times. Similar devices in this technology have a write endurance of >100k.