2.4 Periodic Self-Tests
Once per millisecond, the microcontroller runs a scan to look for detectable faults, to manage scheduled tasks such as running the Class B library self-tests and switching the relay, and to clear the Watchdog Timer.
Once per millisecond, the microcontroller runs a scan to look for detectable faults, to manage scheduled tasks such as running the Class B library self-tests and switching the relay, and to clear the Watchdog Timer.
The online versions of the documents are provided as a courtesy. Verify all content and data in the device’s PDF documentation found on the device product page.