1 Introduction

Test Name: EEPROM Memory Test  

 

Purpose of test: Detect all single bit faults in the EEPROM memory.

Description: A cyclic redundancy check (CRC) is an error detection technique used to find accidental errors in invariable memory. This method is commonly used to verify the data integrity in the EEPROM memory. The test computes a checksum of the data in EEPROM and stores it in another location in EEPROM. To detect errors, a new checksum is computed on the same data and compared with the previous one. If they are different, an error has occurred.
  • Two commonly used CRC standards are supported:
    • 16-bit CRC CCITT

    • 32-bit CRC

  • Two software implementations are supported:
    • Look-up Table (LUT): This uses a CRC look-up table to speed up the computations. The look-up table requires 512 (for 16-bit) or 1024 (for 32-bit) bytes of Flash memory.

    • Direct computation: This calculates the checksum for each byte using a polynomial division. This version occupies less space in the Flash memory, but it is slower than the look-up table method.

API Documentation: EEPROM - 16-bit CRC EEPROM - 32-bit CRC