1 Introduction

Test Name: SRAM Test With March Algorithms

Purpose of Test: Detect stuck bits and coupling Fault in SRAM and on the data bus, as well as any addressing problems.

Description: The internal SRAM is used for storage of volatile data and any Fault related to this can lead to an application not operating correctly. March-C minus algorithm is selected for testing the variable memory. March-C Minus test algorithm is executed in the six steps below:

  • Step 1: Ascending (w0)

  • Step 2: Ascending (r0, w1)

  • Step 3: Ascending (r1, w0)

  • Step 4: Descending (r0, w1)

  • Step 5: Descending (r1, w0)

  • Step 6: Ascending (r0)

API Documentation: SRAM March C- Diagnostic Test