1 Introduction

Test Name: SRAM Test with March Algorithms

Purpose of Test: Detect stuck bits and coupling Faults in SRAM and on the data bus, as well as any addressing problems.

Description: The internal SRAM is used for volatile storage of data and any Fault related to this can be catastrophic for the appliance control. March-C minus algorithm is selected for testing the variable memory.
  • March-C Minus test algorithm is executed in below six steps:

    • Step 1: Ascending (w0)

    • Step 2: Ascending (r0, w1)

    • Step 3: Ascending (r1, w0)

    • Step 4: Descending (r0, w1)

    • Step 5: Descending (r1, w0)

    • Step 6: Ascending (r0)

API Documentation: SRAM March C- Diagnostic Test