9.2 Reliability

The ATECC608C-TNGTLS is fabricated with Microchip’s high reliability CMOS EEPROM manufacturing technology.

Table 9-1. EEPROM Reliability
ParameterMin.Typ.Max.Units
Write Endurance at +85°C (Each Byte)400,000——Write Cycles
Data Retention at +70°C15——Years
Data Retention at +55°C45——Years
Read EnduranceUnlimitedRead Cycles