Functional Description
Test Pin
Debug Architecture
Serial Wire Debug Port (SW-DP) Pins
Embedded Trace Module (ETM) Pins
Flash Patch Breakpoint (FPB)
Data Watchpoint and Trace (DWT)
Instrumentation Trace Macrocell (ITM)
IEEE1149.1 JTAG Boundary Scan
ID Code Register
Parent topic:
Debug and Test Features