Introduction
This document contains API documentation for the diagnostic tests included MPLAB® Code Configurator AVR® IEC60730 Class B Diagnostic Library.
This module contains functional safety diagnostics APIs for Clock Frequency test.
This module contains functional safety diagnostics APIs for CPU Program counter test.
This module contains functional safety diagnostics APIs for CPU Registers.
This module contains APIs to calculate, store and validate 16-bit CCITT CRC for a given EEPROM region.
This module contains APIs to calculate, store and validate 32-bit CCITT CRC for a given EEPROM region.
This module contains APIs to calculate, store and validate 16-bit CCITT CRC for a given FLASH region.
This module contains APIs to calculate, store and validate 32-bit CCITT CRC for a given FLASH region.
This module contains functional safety diagnostics API for Interrupt Frequency Test.
This module contains functional safety diagnostics APIs for SRAM Checkerboard Test.
This module contains functional safety diagnostics APIs for SRAM March-C Minus.
This module contains functional safety diagnostics APIs for WatchDog Timer Test.
This module contains functional safety diagnostics APIs for WatchDog Timer Test.
Here is a list of all documented files with brief descriptions
This file contains common type definitions for Startup and Periodic types of Clock Frequency diagnostics.
This file contains APIs to test Clock Frequency diagnosis periodically.
This file contains API prototypes for Periodic Clock Frequency.
This file contains APIs to test CPU using program counter functional test.
This file contains prototypes for APIs to test CPU Program Counter.
This file contains APIs to test CPU Registers.
This file contains prototypes for APIs to test CPU Registers.
This file contains look up table and an API to read its contents for 16-bit CCITT CRC algorithm.
This file contains prototype of API to read look up table contents for 16-bit CCITT CRC algorithm.
This file contains look up table and an API to read its contents for 32-bit CRC algorithm.
This file contains prototype of API to read look up table contents for 32-bit CRC algorithm.
This common file contains macros that group device specific macros to account for differences and similarities in device architectures.
This file contains prototypes for APIs to calculate, store and validate 16-bit CCITT CRC for a given EEPROM region.
This file contains APIs to test EEPROM using CRC16 CCITT Direct Computation algorithm.
This file contains APIs to test EEPROM using CRC16 CCITT Look-up Table algorithm.
This file contains prototypes for APIs to calculate, store and validate 32-bit CRC for a given EEPROM region.
This file contains APIs to test EEPROM using CRC32 Direct Computation algorithm.
This file contains APIs to test EEPROM using CRC32 Look-up Table algorithm.
This file contains prototypes for APIs to calculate, store and validate 16-bit CCITT CRC for a given FLASH region.
This file contains APIs to test FLASH using CRC16 CCITT Direct Computation algorithm.
This file contains APIs to test FLASH using CRC16 CCITT Look-up Table algorithm.
This file contains prototypes for APIs to calculate, store and validate 32-bit CRC for a given FLASH region.
This file contains APIs to test FLASH using CRC32 Direct Computation algorithm.
This file contains APIs to test FLASH using CRC32 Look-up Table algorithm.
This file contains APIs for Interrupt Frequency test.
This file contains data structures and API prototypes for Interrupt Frequency Test.
This file contains common type definitions for EEPROM and FLASH module.
This file contains APIs to test SRAM using Checkerboard algorithm.
This file contains API prototypes for SRAM Checkerboard algorithm.
This file contains APIs to test SRAM using March-C Minus algorithm.
This file contains API prototypes for SRAM March-C Minus test.
This file contains common type definitions for SRAM diagnostics module.
This file contains APIs to test WDT in Simple-Timer Mode using Indirect Time-Slot Monitoring method.
This file contains APIs to test WDT in Windowed-Timer Mode using Indirect Time-Slot Monitoring method.
This file contains API prototypes for Indirect Time-Slot Monitoring based WDT Test (Windowed-Timer Mode)
Here is a list of all documented files with brief descriptions