3.2 Reliability

The ATECC608C is fabricated with Microchip’s high reliability CMOS EEPROM manufacturing technology.

Table 3-1. EEPROM Reliability
Parameter Min. Typ. Max. Units
Write Endurance at +85°C (Each Byte) 400,000 — — Write Cycles
Data Retention at +70°C 15 — — Years
Data Retention at +55°C 45 — — Years
Read Endurance Unlimited Read Cycles