1 Introduction
Test Name: EEPROM Memory Test
Purpose of test: Detect all single bit faults in EEPROM memory.
Description: A cyclic redundancy check (CRC) is an error detection technique used to find accidental errors in invariable memory. This method is commonly used to determine the data present in the EEPROM memory and the correctness of its transmission. The test computes a checksum of the data in EEPROM and stores it in another location in EEPROM. To detect errors, a new checksum is computed on the same data and compared with the previous one. If they are different, an error has occurred.
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Two commonly used CRC standards are supported:
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16-bit CRC CCITT
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32-bit CRC
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Two software implementations are supported:
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Look-up Table (LUT): This uses a CRC LUT to speed up the computations. The LUT requires 512 (for 16-bit) or 1024 (for 32-bit) bytes of EEPROM memory.
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Direct computation: This calculates the checksum for each byte using a polynomial division. This version occupies no space in the EEPROM memory but is slower than the LUT method.
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Note that the AoUs listed in the Assumption of Use section below must be followed to ensure correct operation. The Examples section show examples of how to follow some of the AoUs for different use cases and different devices.
API Documentation: EEPROM - 16-bit CRC EEPROM - 32-bit CRC