1.10.1 The TSLR2 and TSHR2 Values Stored in the DIA Table Are Incorrect

The Temperature Indicator Low Range (TSLR2) and Temperature Indicator High Range (TSHR2) measurement values stored in the Device Information Area (DIA) in Program Memory are incorrect and should not be used to calculate the device die temperature.

Work Around

The following steps can be used to measure the die temperature (TMEAS):
  1. Place the device in a temperature-controlled environment and allow the device to reach the desired steady-state temperature.
  2. Ensure that the device operating voltage (VDD) is 3.0V, and the ADC positive reference voltage (VREF+) is 2.048V (the Gain and Offset values of the DIA table are measured with these parameters).
  3. Obtain the ADC count value of the measured analog voltage: The analog output voltage, VMEAS, is converted to a digital count value by the Analog-to-Digital Converter (ADC) and is referred to as ADCMEAS.
  4. Obtain the Gain value from the DIA table. This parameter is TSLR1 for the low range setting or TSHR1 for the high range setting of the temperature indicator module.
  5. Obtain the Offset value from the DIA table. This parameter is TSLR3 for the low range setting or TSHR3 for the high range setting of the temperature indicator module.

The following equation provides an estimate for the die temperature based on the above parameters:

Equation 1-1. Die Temperature (in ℃)
TMEAS=(ADCMEAS×Gain)256+Offset10
Where:

ADCMEAS = ADC reading at temperature being measured

Gain = Gain value stored in the DIA table

Offset = Offset value stored in the DIA table

Note: It is recommended to take the average of ten measurements of ADCMEAS to reduce noise and improve accuracy.

Affected Silicon Revisions

A4A5A6B1
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