2.1.1 Module description

This file contains prototypes for APIs to calculate, store and validate 16-bit CCITT CRC for a given EEPROM region.

Fig. 1. Unified Modeling Language (UML) Interface Diagram for EEPROM Test with CRC16:

Fig. 2. UML Sequence Diagram for EEPROM Test with CRC16:

Note:

Microchip Technology Inc. has followed development methods required by Functional Safety Standards and performed extensive validation and static testing to ensure that the code operates as intended. Any modification to the code can invalidate the results of Microchip's validation and testing.