35.4 Power Consumption
The values are measured
power consumption under the following conditions, except where otherwise noted:
- VDD = 3V
- T = 25°C
- OSC20M used as the system clock source, except where otherwise specified
- System power consumption measured with peripherals disabled and without I/O drive
Mode | Description | Condition | Typ. | Max. | Unit | |
---|---|---|---|---|---|---|
Active | Active power consumption | CLK_CPU = 20 MHz (OSC20M) | VDD = 5V | 9.0 | - | mA |
CLK_CPU = 10 MHz (OSC20M div2) | VDD = 5V | 4.8 | - | mA | ||
VDD = 3V | 2.7 | - | mA | |||
CLK_CPU = 5 MHz (OSC20M div4) | VDD = 5V | 2.8 | - | mA | ||
VDD = 3V | 1.6 | - | mA | |||
VDD = 2V | 1.0 | - | mA | |||
CLK_CPU = 32.768 kHz (OSCULP32K) | VDD = 5V | 18 | - | µA | ||
VDD = 3V | 10 | - | µA | |||
VDD = 2V | 7 | - | µA | |||
Idle | Idle power consumption | CLK_CPU = 20 MHz (OSC20M) | VDD = 5V | 2.8 | 6.3(1) | mA |
CLK_CPU = 10 MHz (OSC20M div2) | VDD = 5V | 1.7 | 3.1(1) | mA | ||
VDD = 3V | 0.9 | 1.9(1) | mA | |||
CLK_CPU = 5 MHz (OSC20M div4) | VDD = 5V | 1.2 | 2.0(1) | mA | ||
VDD = 3V | 0.6 | 1.2 | mA | |||
VDD = 2V | 0.4 | - | mA | |||
CLK_CPU = 32.768 kHz (OSCULP32K) | VDD = 5V | 8.0 | 20(1) | µA | ||
VDD = 3V | 4.0 | 15(1) | µA | |||
VDD = 2V | 1.7 | - | µA |
Note:
- These values are based on characterization and not covered by production test limits.
Mode | Description | Condition | Typ. 25°C | Max. 25°C | Max. 85°C(1) | Max. 125°C | Unit | |
---|---|---|---|---|---|---|---|---|
Standby | Standby power consumption | RTC running at 1.024 kHz from external XOSC32K (CL = 7.5 pF) | VDD = 3V | 0.7 | - | - | - | µA |
RTC running at 1.024 kHz from internal OSCULP32K | VDD = 3V | 0.7 | 3.0 | 6.0 | 8.0 | µA | ||
Power Down/Standby | Power down/Standby power consumption are the same when all peripherals are stopped | All peripherals stopped | VDD = 3V | 0.1 | 2.0 | 5.0 | 7.0 | µA |
Reset | Reset power consumption | Reset line pulled down | VDD = 3V | 100 | - | - | - | µA |
Note:
- These values are based on characterization and not covered by production test limits.