Introduction

This application note describes methods to avoid unwanted influences from other applications and how to avoid influencing other applications. Every electrical circuit has the potential to be disturbed by other circuits or even be influenced by them. This influence varies from noncritical to a total malfunction of the circuit, in worst case condition, which leads to the damage of goods or living things. Be sure to avoid any malfunction, even if it is caused by a conducted or radiated influence. For this, every application must pass a certain number of tests to be certified for a special use case. The number and the type of tests is defined by the use case of the application. In addition, the document describes methods and practices for the suitable use of Microchip products in the certification process.

The description in this document is applicable for subsequent listed products:
  • Gen1 transceiver, receiver
    • ATA5830, ATA5830N
    • ATA5780, ATA5780N
  • Gen2 transceiver, receiver, transmitter
    • ATA5831, ATA5832, ATA5833
    • ATA5781, ATA5782, ATA5783, ATA5785
    • ATA8510, ATA8515
    • ATA8210, ATA8215
    • ATA8710
  • Gen3 transceiver, receiver
    • ATA5835
    • ATA5787
  • LF+RF product family
    • ATA5702