6.2 Reliability

The ECC608-TNGHNT is fabricated with Microchip’s high reliability CMOS EEPROM manufacturing technology.

Table 6-1. EEPROM Reliability
ParameterMin.Typ.Max.Units
Write Endurance at +85°C (Each Byte)400,000——Write Cycles
Data Retention at +55°C10——Years
Data Retention at +35°C3050—Years
Read EnduranceUnlimitedRead Cycles