10.2 Reliability

The ATECC608C-TFLXTLS is fabricated with Microchip’s high reliability CMOS EEPROM manufacturing technology.

Table 10-1. EEPROM Reliability
ParameterMin.Typ.Max.Units
Write Endurance at +85°C (Each Byte)400,000Write Cycles
Data Retention at +70°C15Years
Data Retention at +55°C45Years
Read EnduranceUnlimitedRead Cycles