2.5 EEPROM Memory Checksum CRC Test

Test Name: EEPROM_MEMORY_CHECKSUM_CRC_TEST

Software Requirement ID: SW_EEPROM_MEMORY_CHECKSUM_CRC_TEST_01

Purpose of test: Detect all single bit faults in EEPROM memory.

Description: A cyclic redundancy check (CRC) has been implemented to test the invariable memory. This is an error detection technique used to find accidental errors in data. This method is commonly used to determine the correctness of data transmissions and data present in EEPROM memory. Test should compute a checksum of the data and store it. In order to detect errors, a new checksum is computed on the same data and compared with the previous one. If they are different, there is an error.

• Two commonly used CRC standards are supported:
  • 16-bit CRC CCITT
  • 32-bit CRC
• Two software implementations are supported:
  • Lookup table:This uses a CRC look-up table to speed up the computations. The look-up table requires 512 (for 16-bit) or 1024 (for 32-bit) bytes of flash memory.
  • Direct computation: This calculates the checksum for each byte using a polynomial division. This version occupies no space in the Flash memory but is slower than the lookup table method.

API Documentation: SW_EEPROM_MEMORY_CHECKSUM_CRC_TEST_01 - CRC16,SW_EEPROM_MEMORY_CHECKSUM_CRC_TEST_01 - CRC32