Introduction

This document contains API documentation for the diagnostic tests included in the MPLABĀ® Code Configurator PIC16/18 IEC60730 Class B Diagnostic Library.

Table 1. IEC60730 Functional Safety Diagnostic Tests
Component Sub-Component Acceptable Measure (Annex. H) Available Diagnostic Test
PIC16 PIC18
CPU Registers Functional Test (H.2.16.5) CPU Register Test CPU Register Test
Program Counter Functional Test (H.2.16.5) CPU Program Counter CPU Program Counter
Time-slot monitoring of the program sequence (H.2.18.10.4) WDT Simple Test WDT Simple Test
WDT Windowed Test WDT Windowed Test
Clock Frequency monitoring (H.2.18.10.1) Clock Test using Secondary Reference Oscillator Clock Test using Secondary Reference Oscillator
Time-slot monitoring of the program sequence (H.2.18.10.4) Clock Line Frequency Test Clock Line Frequency Test
Interrupt Time-slot monitoring of the program sequence (H.2.18.10.4) Interrupt Frequency Test Interrupt Frequency Test
Memory Invariable Modified checksum (H.2.19.3.1) EEPROM CRC Test EEPROM CRC Test
FLASH CRC Test FLASH CRC Test
Variable Static Memory Test (H.2.19.6) SRAM Checkerboard Test SRAM Checkerboard Test
SRAM March Test SRAM March Test
Stack March Test Stack March Test