41.3 Absolute Maximum Ratings
Stresses beyond those listed in this section may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
| Symbol | Description | Min. | Max. | Units |
|---|---|---|---|---|
| VDD | Power supply voltage | 0 | 3.8 | V |
| IVDD | Current into a VDD pin | - | 92(1) | mA |
| IGND | Current out of a GND pin | - | 130(1) | mA |
| VPIN | Pin voltage with respect to GND and VDD | GND-0.6V | VDD+0.6V | V |
| Tstorage | Storage temperature | -60 | 150 | °C |
- Maximum source current is 46mA and maximum sink current is 65mA per cluster. A cluster is a group of GPIOs as shown in the table below. Also note that each VDD/GND pair is connected to two clusters so current consumption through the pair will be a sum of the clusters source/sink currents.
CAUTION: This device is sensitive
to electrostatic discharges (ESD). Improper handling may lead to permanent performance
degradation or malfunctioning.
Handle the device following best practice ESD protection rules: Be aware that the human body can accumulate charges large enough to impair functionality or destroy the device.
CAUTION: In debugger
cold-plugging mode, NVM erase operations are not protected by the BOD33 and BOD12. NVM erase operation at supply voltages below specified minimum can cause
corruption of NVM areas that are mandatory for correct device behavior.