Table 40-37. Maximum Operating Frequency (Device Variant A)| VDD range | NVM Wait States | Maximum Operating Frequency | Units |
|---|
| 2.7V to 3.63V | 0 | 24 | MHz |
| 1 | 40 |
Table 40-38. Maximum Operating Frequency
(Device Variant B and D)| VDD range | NVM Wait States | Maximum Operating Frequency | Units |
|---|
| 2.7V to 3.63V | 0 | 24 | MHz |
| 1 | 48 |
Note: With on this flash technology, a max number of 8 consecutive write is allowed per row.
Once this number is reached, a row erase is mandatory.
Table 40-39. Flash Endurance and Data Retention (Device Variant A)| Symbol | Parameter | Conditions | Min. | Typ. | Max. | Units |
|---|
| RetNVM25k | Retention after up to 25k | Average ambient 55°C | 10 | 50 | - | Years |
| RetNVM2.5k | Retention after up to 2.5k | Average ambient 55°C | 20 | 100 | - | Years |
| RetNVM100 | Retention after up to 100 | Average ambient 55°C | 25 | >100 | - | Years |
| CycNVM | Cycling Endurance(1) | -40°C < Ta < 125°C | 10K | - | - | Cycles |
Table 40-40. Flash Endurance and Data Retention
(Device Variant B and D)| Symbol | Parameter | Conditions | Min. | Typ. | Max. | Units |
|---|
| RetNVM25k | Retention after up to 25k | Average ambient 55°C | 10 | 50 | - | Years |
| RetNVM2.5k | Retention after up to 2.5k | Average ambient 55°C | 20 | 100 | - | Years |
| RetNVM100 | Retention after up to 100 | Average ambient 55°C | 25 | >100 | - | Years |
| CycNVM | Cycling Endurance(1) | -40°C < Ta < 125°C | 25k | - | - | Cycles |
Note:
- An endurance cycle is a write and an erase operation.
Table 40-41. EEPROM Emulation(1) Endurance and Data Retention (Device Variant
A)| Symbol | Parameter | Conditions | Min. | Typ. | Max. | Units |
|---|
| RetEEPROM100k | Retention after up to 100k | Average ambient 55°C | 10 | 50 | - | Years |
| RetEEPROM10k | Retention after up to 10k | Average ambient 55°C | 20 | 100 | - | Years |
| CycEEPROM | Cycling Endurance(2) | -40°C < Ta < 125°C | 40K | - | - | Cycles |
Table 40-42. EEPROM Emulation(1)
Endurance and Data Retention (Device Variant B and D)| Symbol | Parameter | Conditions | Min. | Typ. | Max. | Units |
|---|
| RetEEPROM100k | Retention after up to 100k | Average ambient 55°C | 10 | 50 | - | Years |
| RetEEPROM10k | Retention after up to 10k | Average ambient 55°C | 20 | 100 | - | Years |
| CycEEPROM | Cycling Endurance(2) | -40°C < Ta < 125°C | 100k | - | - | Cycles |
Table 40-43. NVM Characteristics | Symbol | Parameter | Conditions | Min. | Typ. | Max. | Units |
|---|
| tFPP | Page programming time | - | - | - | 2.5 | ms |
| tFRE | Row erase time | - | - | - | 6 | ms |
| tFCE | DSU chip erase time (CHIP_ERASE) | - | - | - | 240 | ms |