2.3 Group 3
Group 3 of the I3C target CTS verifies can properly detect and recover from error conditions.
| Test | Description | Silicon Revision Result | Comments | ||
|---|---|---|---|---|---|
| B2 | C0 | ||||
| T-2.3.1 | Error Type TE0 | Tests whether the target can detect and recover from TE0 errors | Not Pass | Pass | On B2 silicon, DUT cannot recover from TE0 error. See Appendix 2. |
| T-2.3.2 | Error Type TE1 | Tests whether the target can detect and recover from TE1 errors | Pass | Pass | |
| T-2.3.3 | Error Type TE2 | Tests whether the target can detect and recover from TE2 errors | Pass | Pass | |
| T-2.3.4 | Error Type TE3 | Tests whether the target can detect parity errors during DAA | Pass | Pass | T2 N/A |
| T-2.3.5 | Error Type TE4 | Tests whether the target can detect TE4 errors during DAA | Not Pass | Pass | On B2 silicon, DUT incorrectly ACKs repeated Start followed by
7’h7E/W. See Appendix
1. |
| T-2.3.6 | Error Type TE5 | Tests whether the target can detect TE5 errors during direct CCC | Pass | Pass | |