4.5.3 EEPROM Cell Performance Characteristics
Operation | Test Condition | Min. | Max. | Units |
---|---|---|---|---|
Write Endurance(1) | TA = +25°C, VCC (min.) <
VCC < VCC (max.), Byte or Page Write mode | 1,000,000 | — | Write Cycles |
Data Retention(1) | TA = +55°C | 100 | — | Years |
Note:
- Performance is determined through characterization and the qualification process.