7.1 Absolute Maximum Ratings

Stresses exceeding those listed in this section could cause permanent damage to the device. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Functional operation of the device at any condition exceeding those indicated in Operating Conditions, DC Specifications, or any other applicable section of this specification is not implied.

Attention: Exposure at or above these limits may damage the device.

Table 7-1. Absolute Maximum Ratings
Parameter		Symbol	Min	Max	Units	Notes
Power Supply Voltage:						Note 1
	Digital I/O (VDDP)		-0.5	3.9	V
	Analog (VDDA)		-0.5	3.9	V
	Continuous (VDDAU)		-0.5	3.9	V
Voltage applied to pins:
	TRXP, TRXN	V_TRXP/N	-27	42	V
	TRXP/TRXN (differential)	V_DIFF	-32	32	V
	XTI/REFCLKIN, RBIAS		-0.5	VDDA + 0.5	V	Note 2
	WAKE_IN		-0.5	VDDAU+ 0.5	V	Note 2
	All other pins		-0.5	VDDP + 0.5	V	Note 2
Junction Temperature Under Bias		T_J	-40	150	°C
Storage Temperature		T_stg	-55	150	°C
Lead Temperature Range		Refer to JEDEC Spec. J-STD-020
ESD Human Body Model			-8	+8	kV	Note 3
ESD Charge Device Model			-1	+1	kV	AEC-Q100-011
Note: When powering this device from laboratory or system power supplies, it is important that the absolute maximum ratings not be exceeded or device failure can result. Some power supplies exhibit voltage spikes on their outputs when AC power is switched on or off. In addition, voltage transients on the AC power line may appear on the DC output. If this possibility exists, it is suggested that a clamp circuit be used. Voltage applied to pins must remain below 3.9V. Test specification following JESD22-A114/AEC-Q100-002: (1.5 kΩ/100 pF)

LAN8670/1/2

7.1 Absolute Maximum Ratings