2 Our Approach

The main objective of this application note is to provide SAMA5D2 adopters with practical implementation guidelines and software settings, inferred from actual hardware and extensive tests performed on that hardware:

Figure 2-1. Obtaining Optimal Hardware and Software Implementation

To ensure proper functionality of all SDRAM devices supported by the external memory controller (MPDDRC), numerous hardware and software considerations must be taken into account. While low-speed circuits have few physical constraints on the PCB, circuits featuring high-speed signals do have constraints that must be applied regarding trace length, width and clearance, PCB stacking, and length matching. These rules were applied when designing previously released development kits such as SAMA5D2-XULT and SAMA5D2-PTC-EK. In addition, a custom board has been designed and produced for the purpose of further testing to ensure proper compatibility of SAMA5D2 MPUs with all supported SDRAM devices from different manufacturers.

In addition to the boards, several pieces of testing software were developed. See the figure below.

Figure 2-2. Stress Test Algorithm

The table below describes the testing cases.

Table 2-1. Testing Cases
Test Case No.DescriptionPurpose
1Performs pin stuck at high/low test

Writes sequential data patterns

Checks data integrity
2Generates and writes random dataChecks data mismatch, unaligned access
3Generates and transfers large data buffersChecks data transfers in memory via DMA controller

All SDRAM devices are tested at a clock frequency of 166 MHz (clock period is 6 ns).

Important: The board used for the tests was designed for use in a commercial temperature range, therefore this study is limited to the 0°C to +70°C range. This does not mean that the components involved – SAMA5D2 and DDR memory – are limited to function in that range. On the contrary, industrial grades are available and work equally well in the extended -40°C to +85°C range.

Microchip performed such tests using a programmable climatic chamber.

During testing, all test results returned were logged for further analysis.