21.5.7 RTC Accurate Clock Calibration

The crystal oscillator that drives the RTC may not be as accurate as expected mainly due to temperature variation. The RTC is equipped with circuitry able to correct slow clock crystal drift.

To compensate for possible temperature variations over time, this accurate clock calibration circuitry can be programmed on-the-fly and also programmed during application manufacturing, in order to correct the crystal frequency accuracy at room temperature (20–25°C). The typical clock drift range at room temperature is ±20 ppm.

In the device operating temperature range, the 32.768 kHz crystal oscillator clock inaccuracy can be up to -200 ppm.

The RTC clock calibration circuitry allows positive or negative correction in a range of 1.5 ppm to 1950 ppm.

The calibration circuitry is fully digital. Thus, the configured correction is independent of temperature, voltage, process, etc., and no additional measurement is required to check that the correction is effective.

If the correction value configured in the calibration circuitry results from an accurate crystal frequency measure, the remaining accuracy is bounded by the values listed below:

• Below 1 ppm, for an initial crystal drift between 1.5 ppm up to 20 ppm, and from 30 ppm to 90 ppm
• Below 2 ppm, for an initial crystal drift between 20 ppm up to 30 ppm, and from 90 ppm to 130 ppm
• Below 5 ppm, for an initial crystal drift between 130 ppm up to 200 ppm

The calibration circuitry does not modify the 32.768 kHz crystal oscillator clock frequency but it acts by slightly modifying the 1 Hz clock period from time to time. The correction event occurs every 1 + [(20 - (19 x HIGHPPM)) x CORRECTION] seconds. When the period is modified, depending on the sign of the correction, the 1 Hz clock period increases or reduces by around 4 ms. Depending on the CORRECTION, NEGPPM and HIGHPPM values configured in RTC_MR, the period interval between two correction events differs.

The inaccuracy of a crystal oscillator at typical room temperature (±20 ppm at 20–25 °C) can be compensated if a reference clock/signal is used to measure such inaccuracy. This kind of calibration operation can be set up during the final product manufacturing by means of measurement equipment embedding such a reference clock. The correction of value must be programmed into RTC_MR, and this value is kept as long as the circuitry is powered (backup area). Removing the backup power supply cancels this calibration. This room temperature calibration can be further processed by means of the networking capability of the target application.

Note that this adjustment does not take into account the temperature variation.

The frequency drift (up to -200 ppm) due to temperature variation can be compensated using a reference time if the application can access such a reference. If a reference time cannot be used, a temperature sensor can be placed close to the crystal oscillator in order to get the operating temperature of the crystal oscillator. Once obtained, the temperature may be converted using a lookup table (describing the accuracy/temperature curve of the crystal oscillator used) and RTC_MR configured accordingly. The calibration can be performed on-the-fly. This adjustment method is not based on a measurement of the crystal frequency/drift and therefore can be improved by means of the networking capability of the target application.

If no crystal frequency adjustment has been done during manufacturing, it is still possible to make adjustments. In the case where a reference time of the day can be obtained through a LAN/WAN network, it is possible to calculate the drift of the application crystal oscillator by comparing the values read on RTC_TIMR and RTC_CALR and programming RTC_MR.HIGHPPM and RTC_MR.CORRECTION according to the difference measured between the reference time and those of RTC_TIMR and RTC_CALR.