54.2 Embedded Characteristics

  • 256-bit Key Entropy
  • On-chip Enrollment
  • Key Derivation and Wrapping
  • Deterministic Random Number Generator (DRNG) According to NIST SP800-90A/B
  • PUF Diagnostics
  • Built-In Self-Test (BIST)
  • Functional Safety Monitors and Reports
    • Abnormal software access reports (undefined address, writing a read-only register, reading a write-only register)