54.2 Embedded Characteristics
- 256-bit Key Entropy
- On-chip Enrollment
- Key Derivation and Wrapping
- Deterministic Random Number Generator (DRNG) According to NIST SP800-90A/B
- PUF Diagnostics
- Built-In Self-Test (BIST)
- Functional Safety Monitors and Reports
- Abnormal software access reports (undefined address, writing a read-only register, reading a write-only register)