2.1 Radiation Testing

Total Ionizing Dose (TID)

Microchip completed TID testing per MIL-STD-883, Method 1019, Test Condition A with completed oscillators being subjected to a total dose of 50krad.

All parameters measured remained within the required datasheet specifications.

Single Event Latch-up (SEL)

Microchip completed SEL testing per the ASTM F1192 and the EIA/JESD57 testing standards.

Testing resulted in active die being latch-up immune up to a Linear Energy Transfer (LET) of 44.8MeV-cm2/mg while the device was heated to 125°C. No additional testing was performed beyond this LET.

There were no destructive SEL events observed.

More Information

Further inquiries about the specifics of the radiation testing can be made by emailing the Mount Holly Springs, PA factory at VOP-Support@microchip.com

We understand the need for short-lead-time parts for prototyping or possibly flight and have established low-volume inventory solely for this purpose. Please email us, so we can work together to see if our available inventory meets your quick-turn needs at VOP-Support@microchip.com