Note: Stresses in excess of the absolute maximum ratings can
permanently damage the device. Functional operation is not implied at these or any other
conditions in excess of the conditions represented in the operational sections of this
data sheet. Exposure to absolute maximum ratings for extended periods may adversely
affect device reliability. Permanent damage is also possible if E/D is applied before
VDD.
Table 1-2. ESD Ratings
Model
Minimum
Conditions
Human Body Model
2000V
MIL-STD-883, Method 3015
Charged Device Model
750V
JESD22-C101
Note: Although ESD protection circuitry has been designed into the
VC-870, proper precautions should be taken when handling and mounting. Microchip employs
a human body model (HBM) and a charged device model (CDM) for ESD susceptibility testing
and design protection evaluation.
The power supply
should have bypass capacitors as close to the supply and to
ground as possible (for example, 0.1µF and 0.01µF).
Parameters are
tested with the production test circuit in Figure 1-1.
Duty Cycle is
measured as On-Time/Period (see Figure 1-2).
A 10kΩ pull-up
resistor to VDD is recommended if the E/D pin is unused.
Figure 1-1. Test CircuitFigure 1-2. Waveform
DS20007188A
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