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AN5484 - Implementing the Class B Functional Safety Diagnostics Library in Microcontrollers
AN5484 - Implementing the Class B Functional Safety Diagnostics Library in Microcontrollers
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AVR16EA28 AVR16EA32 AVR16EA48 AVR32EA28 AVR32EA32 AVR32EA48 AVR64EA28 AVR64EA32 AVR64EA48
  1. Home
  2. 6 Functional Safety Tests Implemented
  3. 6.4 SRAM

  • Introduction
  • 1 Functional Safety Standards and Levels
  • 2 Functional Safety Tools and Documents
  • 3 The Application
  • 4 Building the Application
  • 5 Sensor Theory of Operation
  • 6 Functional Safety Tests Implemented
    • 6.1 CPU Registers
    • 6.2 Flash
    • 6.3 EEPROM
    • 6.4 SRAM
  • 7 Watchdog
  • 8 Application Specific Self-Tests
  • 9 Self-Test Limitations
  • 10 Conclusion
  • 11 Revision History
  • Microchip Information

6.4 SRAM

API Reference: https://onlinedocs.microchip.com/oxy/GUID-1BC922B5-0BDE-4D42-AC92-68359BB22BEC-en-US-1/GUID-E58EEFF6-B49E-48AC-B5F9-3A380DE1CDFB.html

  • When the test is run: Start-up and periodically

On start-up, the SRAM test destructively tests the entire SRAM memory of the microcontroller to look for faults. However, it cannot be re-run without restarting the application as this test is destructive. Instead, periodically, small portions of memory are scanned for faults.

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