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AN5484 - Implementing the Class B Functional Safety Diagnostics Library in Microcontrollers
AN5484 - Implementing the Class B Functional Safety Diagnostics Library in Microcontrollers
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AVR16EA28 AVR16EA32 AVR16EA48 AVR32EA28 AVR32EA32 AVR32EA48 AVR64EA28 AVR64EA32 AVR64EA48
  1. Home
  2. 6 Functional Safety Tests Implemented
  3. 6.2 Flash

  • Introduction
  • 1 Functional Safety Standards and Levels
  • 2 Functional Safety Tools and Documents
  • 3 The Application
  • 4 Building the Application
  • 5 Sensor Theory of Operation
  • 6 Functional Safety Tests Implemented
    • 6.1 CPU Registers
    • 6.2 Flash
      • 6.2.1 Hardware CRC Support
      • 6.2.2 Modifications to the Class B Library
    • 6.3 EEPROM
    • 6.4 SRAM
  • 7 Watchdog
  • 8 Application Specific Self-Tests
  • 9 Self-Test Limitations
  • 10 Conclusion
  • 11 Revision History
  • Microchip Information

6.2 Flash

API Reference: https://onlinedocs.microchip.com/oxy/GUID-1AB1E325-9BB2-4783-B223-5BE21C8A4C83-en-US-1/GUID-6142E093-8557-4AEC-AC4B-B56D7FF8C4D5.html

  • When is the test run: Start-up and Periodically
  • Configuration: CRC-32 Look-up Table (LUT)

The flash test verifies the integrity of the Program Flash Memory (PFM) by performing a CRC-32 checksum on the system memory.

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