2.9 SRAM March Test

Test Name: SRAM Test with March Algorithms.

Acceptable Measure (Annex. H): Static Memory Test (H.2.19.6)

Purpose of test: Detect stuck bits and coupling faults in SRAM and on the data bus, as well as any addressing problems.

Description: The internal SRAM is used for volatile storage of data and any faults related to this can be catastrophic for the appliance control. March-C minus algorithm is selected for testing the variable memory.

• March-C Minus test algorithm is executed in below 6 steps:
  • Step-1: Ascending(W0)
  • Step-2: Ascending(r0, w1)
  • Step-3: Ascending(r1, w0)
  • Step-4: Descending(r0, w1)
  • Step-5: Descending(r1, w0)
  • Step-6: Ascending(r0)

API Documentation: SRAM March C Minus Diagnostic Test