Introduction
This document contains API documentation for the diagnostic tests included in the MPLAB® Code Configurator PIC16/18 IEC60730 Class B Diagnostic Library.
Component | Sub-Component | Acceptable Measure (Annex. H) | Available Diagnostic Test | |
---|---|---|---|---|
PIC16 | PIC18 | |||
CPU | Registers | Functional Test (H.2.16.5) | CPU Register Test | CPU Register Test |
Program Counter | Functional Test (H.2.16.5) | CPU Program Counter | CPU Program Counter | |
Time-slot monitoring of the program sequence (H.2.18.10.4) | WDT Simple Test | WDT Simple Test | ||
WDT Windowed Test | WDT Windowed Test | |||
Clock | Frequency monitoring (H.2.18.10.1) | Clock Test using Secondary Reference Oscillator | Clock Test using Secondary Reference Oscillator | |
Time-slot monitoring of the program sequence (H.2.18.10.4) | Clock Line Frequency Test | Clock Line Frequency Test | ||
Interrupt | Time-slot monitoring of the program sequence (H.2.18.10.4) | Interrupt Frequency Test | Interrupt Frequency Test | |
Memory | Invariable | Modified checksum (H.2.19.3.1) | EEPROM CRC Test | EEPROM CRC Test |
FLASH CRC Test | FLASH CRC Test | |||
Variable | Static Memory Test (H.2.19.6) | SRAM Checkerboard Test | SRAM Checkerboard Test | |
SRAM March Test | SRAM March Test | |||
Stack March Test | Stack March Test |