11.5.5 IEEE 1149.1 JTAG Boundary Scan

IEEE 1149.1 JTAG Boundary Scan allows pin-level access independent of the device packaging technology.

IEEE 1149.1 JTAG Boundary Scan is enabled when JTAGSEL is high. The SAMPLE, EXTEST and BYPASS functions are implemented. In ICE debug mode, the Arm processor responds with a non-JTAG chip ID that identifies the processor to the ICE system. This is not IEEE 1149.1 JTAG-compliant.

It is not possible to switch directly between JTAG and ICE operations. A chip reset must be performed after JTAGSEL is changed.

A Boundary-scan Descriptor Language (BSDL) file is provided to set up the test.