6.1 Absolute Maximum Ratings

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Parameters	Symbol	Min.	Max.	Unit
Junction Temperature	T_J	-40	170	°C
Storage Temperature	T_S	-55	150	°C
DC Voltage on the VS, VDH, INH, LH pins	V_VS, V_VDH, V_INH, V_LH	-0.3	42	V
LIN DC Voltage Pulse time < 500 ms	‎ V_LIN	‎ -27	‎ +42 +43.5	‎ V
DC Voltage on the WAKE pin	V_WAKE	-1.5	42	V
DC Voltage on the TXD, RXD, NIRQ, SDO, SDI, NCS, SCK, NIHx, ILx pins	V_X	-0.3	V_VIO + 0.3	V
DC Voltage on the NRES pin	V_NRES	-0.3	10	V
DC Voltage on the VDD1 pin	V_VDD1	-0.3	5.85	V
DC Voltage on the VDD2 pin	V_VDD2	-0.3	5.5	V
DC Common Mode Voltage on the OPPx, OPNx pins	V_OPPX, V_OPNX	-5.5	5.5	V
DC Voltage on the BEMFx, OPOx pins	V_BEMFX, V_OPOX	-0.3	V_VIO + 0.3	V
DC Voltage on the VG, CPN2 pins	V_VG, V_CPN2	-0.3	15	V
DC Voltage on the GHx to SHx pins	V_GHX-V_SHX	-0.3	15	V
DC Voltage on the GHx pin	V_GHX	V_SHX – 0.3	V_VCP + 0.3	V
DC Voltage on the SHx pin	V_SHX	-5.5	VDH+1.5	V
Pulse Voltage on the SHx pin, Transient <500ns	V_SHX	SL - 5.5 (ATA6847L)	VDH+3.0	V
DC Voltage on the GLx pin	V_GLX	V_GND or V_SL– 0.3	V_VG + 0.3	V
DC Voltage on the GLx to GND pins (ATA6847)	V_GLX-V_GND (ATA6847)	-0.3	15	V
DC Voltage on the GLx to SL pins (ATA6847L)	V_GLX-V_SL(ATA6847L)	-0.3	15	V
DC Voltage on the SL pin (ATA6847L)	V_SL (ATA6847L)	-5.5	5.5	V
Differential DC Voltage between GND , GNDLIN and GNDEP (exposed die pad)	—	-0.3	0.3	V
DC Voltage on CPN1, CPP1	V_CPN1, V_CPP1	-0.3	42	V
DC Voltage on CPP2, VCP	V_CPP2, V_VCP	-0.3	55	V
DC Voltage on the VCP to VDH	V_VCP-V_VDH	-0.3	15	V
ESD following IEC 62228-2: (330Ω/150 pF) Pins VS, VDH, WAKE to GND	—	-8	+8	kV
ESD following IEC 62228-2: (330Ω/150 pF) Pins LIN to GND	—	-8	+8	kV
HBM JESD22-A114/AEC-Q100-002 (1.5 kΩ/100 pF) All pins Pins VS, VDH, WAKE to GND LIN to GND	—	-2 -6 -8	+2 +6 +8	kV kV kV
Charge Device Model ESD AEC-Q100-011 - All pins	—	-750	750	V

Attention: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the device within these or any other conditions beyond those indicated in the DC/AC Characteristics of this datasheet is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.