3.5.3 EEPROM Cell Performance Characteristics
Operation | Min. | Max. | Units | Test Condition |
---|---|---|---|---|
Write Cycle Time (tWR) | — | 5 | ms | VPUP (min.) < VPUP < VPUP (max.), TA = +25°C, Byte or Page Write mode |
Write Endurance(1) | 1,000,000 | — | Write Cycles | VPUP (min.) < VPUP < VPUP (max.), TA = +25°C, Byte or Page Write mode |
Data Retention(1) | 100 | — | Years | TA = +55°C |
Note:
- Performance is determined through characterization and the qualification process.