Hamming Distance - For binary
numbers, it can be expressed as the number of ones in the result of A XOR B.
Static Memory Testing - Test of nonvolatile memory.
Time-slot monitoring - Some
continuous test of events happening within a set time period.
March algorithms - Algorithms
that goes sequentially over RAM writing and later verifying content in RAM
in multiple stages.
Coupling faults (CFs) - A
connection between different memory units causing both to change when only
one should.
The online versions of the documents are provided as a courtesy. Verify all content and data in the device’s PDF documentation found on the device product page.
