6.3 DC Characteristics 

Table 6-4. DC Characteristics
SymbolParameterIndustrial (I): TAMB = -40°C to +85°C

Industrial Plus (V): TAMB = -40°C to +105°C

Min.Max.UnitsConditions
IDDR1Read Current18mAVDD = VDD maximum, CE# = 0.1 VDD/0.9 VDD@166 MHz, SIO = open
IDDR2Read Current16mAVDD = VDD maximum, CE# = 0.1 VDD/0.9 VDD@80 MHz, SIO = open
IDDR3Read Current16mAVDD = VDD maximum, CE# = 0.1 VDD/0.9 VDD@108 MHz DTR, SIO = open
IDDWProgram and Erase Current15mACE# = VDD
IWRSRWrite STATUS Register Current (nonvolatile value)12mACE# = VDD
ISB1Standby Current30μACE# = VDD, VIN = VDD or VSS (for Industrial part)
ISB2Standby Current40μACE# = VDD, VIN =VDD or VSS (for Industrial Plus part)
IPD1Power-Down Current10μACE# = VDD, VIN = VDD or VSS

(for Industrial part)

IPD2Power-Down Current15μACE# = VDD, VIN = VDD or VSS

(for Industrial Plus part)

ILIInput Leakage Current+/-2μAVIN = GND to VDD, VDD = VDD maximum
ILOOutput Leakage Current+/-2μAVIN = GND to VDD, VDD = VDD maximum
VILInput Low Voltage-0.50.3VDDVVDD = VDD minimum
VIHInput High Voltage0.7VDDVDD+0.4VVDD = VDD maximum
VOL1Output Low Voltage0.2VIOL = 100 μA, VDD = VDD minimum
VOHOutput High VoltageVDD-0.2VIOH = -100 μA, VDD = VDD minimum
Table 6-5. Capacitance (TA = +25°C, F = 1 MHZ, other pins open)
ParameterDescriptionTest ConditionMaximum
COUT(1)Output Pin CapacitanceVOUT = 0V8 pF
CIN(1)Input CapacitanceVIN = 0V6 pF
Note:
  1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
Table 6-6. Reliability Characteristics
SymbolParameterMinimum SpecificationUnitsTest Method
NEND(1)Endurance100,000cyclesJEDEC Standard A117
TDR(1)Data Retention20yearsJEDEC Standard A103
ILTH(1)Latch Up200mAJEDEC Standard 78
Note:
  1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
Table 6-7. Write Timing Parameters
SymbolParameterMinimumMaximumUnits
TSESector Erase300ms
TBE32KBBlock Erase (32 KB)0.8s
TBE64KBBlock Erase (64 KB)1s
TSCEChip Erase100s
TPPPage Program2ms
TESRErase Security Register 1/2/3 (typical 14 ms)6.4ms
TPSRProgram Security Register 1/2/3 (typical 318 µs)150µs