6.3 DC Characteristics
| Symbol | Parameter | Industrial (I): TAMB = -40°C to +85°C Industrial Plus (V): TAMB = -40°C to +105°C | |||
|---|---|---|---|---|---|
| Min. | Max. | Units | Conditions | ||
| IDDR1 | Read Current | — | 18 | mA | VDD = VDD maximum, CE# = 0.1 VDD/0.9 VDD@166 MHz, SIO = open |
| IDDR2 | Read Current | — | 16 | mA | VDD = VDD maximum, CE# = 0.1 VDD/0.9 VDD@80 MHz, SIO = open |
| IDDR3 | Read Current | — | 16 | mA | VDD = VDD maximum, CE# = 0.1 VDD/0.9 VDD@108 MHz DTR, SIO = open |
| IDDW | Program and Erase Current | — | 15 | mA | CE# = VDD |
| IWRSR | Write STATUS Register Current (nonvolatile value) | — | 12 | mA | CE# = VDD |
| ISB1 | Standby Current | — | 30 | μA | CE# = VDD, VIN = VDD or VSS (for Industrial part) |
| ISB2 | Standby Current | — | 40 | μA | CE# = VDD, VIN =VDD or VSS (for Industrial Plus part) |
| IPD1 | Power-Down Current | — | 10 | μA | CE# = VDD, VIN = VDD or VSS (for Industrial part) |
| IPD2 | Power-Down Current | — | 15 | μA | CE# = VDD, VIN = VDD or VSS
(for Industrial Plus part) |
| ILI | Input Leakage Current | — | +/-2 | μA | VIN = GND to VDD, VDD = VDD maximum |
| ILO | Output Leakage Current | — | +/-2 | μA | VIN = GND to VDD, VDD = VDD maximum |
| VIL | Input Low Voltage | -0.5 | 0.3VDD | V | VDD = VDD minimum |
| VIH | Input High Voltage | 0.7VDD | VDD+0.4 | V | VDD = VDD maximum |
| VOL1 | Output Low Voltage | — | 0.2 | V | IOL = 100 μA, VDD = VDD minimum |
| VOH | Output High Voltage | VDD-0.2 | — | V | IOH = -100 μA, VDD = VDD minimum |
| Parameter | Description | Test Condition | Maximum |
|---|---|---|---|
| COUT(1) | Output Pin Capacitance | VOUT = 0V | 8 pF |
| CIN(1) | Input Capacitance | VIN = 0V | 6 pF |
Note:
- This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
| Symbol | Parameter | Minimum Specification | Units | Test Method |
|---|---|---|---|---|
| NEND(1) | Endurance | 100,000 | cycles | JEDEC Standard A117 |
| TDR(1) | Data Retention | 20 | years | JEDEC Standard A103 |
| ILTH(1) | Latch Up | 200 | mA | JEDEC Standard 78 |
Note:
- This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
| Symbol | Parameter | Minimum | Maximum | Units |
|---|---|---|---|---|
| TSE | Sector Erase | — | 300 | ms |
| TBE32KB | Block Erase (32 KB) | — | 0.8 | s |
| TBE64KB | Block Erase (64 KB) | — | 1 | s |
| TSCE | Chip Erase | — | 100 | s |
| TPP | Page Program | — | 2 | ms |
| TESR | Erase Security Register 1/2/3 (typical 14 ms) | — | 6.4 | ms |
| TPSR | Program Security Register 1/2/3 (typical 318 µs) | — | 150 | µs |
