The Accumulator Test mode aids in diagnostics of the accumulator and result formatting
hardware, and can test the integrity of the logic. It is enabled by configuring the MODE bit
field in the Command (ADCn.COMMAND) register to ACCTEST.
The Accumulator Test mode is used as follows:
Writing to the Result (ADCn.RESULT) register writes to the internal 20-bit
accumulator
Writing to the Sample (ADCn.SAMPLE) register accumulates the 10 LSb of the written value
in the internal 20-bit accumulator
Reading the Result register will read the
16 bits of the accumulator
Figure 31-6. Accumulator Test
Note:
If the Result Scaling (SCALING) bit
field in the Control F (ADCn.CTRLF) register is ‘1’, a value written to
the accumulator will be left-adjusted by 4 bits.
If the SCALING bit field is
‘1’, the 16 MSb of the 20-bit internal accumulator will be read; if
SCALING bit is ‘0’, the 16 LSb of the 20-bit internal accumulator will
be read.
Figure 31-7. Register Access and Adjustment
DS40002685A
The online versions of the documents are provided as a courtesy. Verify all content and data in the device’s PDF documentation found on the device product page.
