1 Errata for IGLOO 2 Devices

The following table lists the specific device Errata and the affected IGLOO 2 devices. Refer to the Marking Specification Details in the PB0121:IGLOO 2 FPGA Product Brief for this Die revision part marking specification.

Table 1-1. Summary of IGLOO 2 Device Errata
Errata No.

Errata

Silicon Revision(s) AffectedSoftware Errata
M2GL005M2GL010M2GL025M2GL060M2GL090M2GL150
01,201,2301,2001,2301,2
1.VPP must be set to 2.5V when programming or writing the eNVM at Industrial temperature rangeX1 —X1 — —X1 — — — — — — — —
2.Overvoltage support on MSIOs during Flash*Freeze modeX1 —X1 — —X1 — — — — — — — —
3.Verification of the FPGA fabric at junction temperatures higher than 50 °C erroneously indicates a failureX1 —X1 — —X1 — — — — — — — —
4.DDR_OUT and I/O-Reg functional Errata due to a software bug — — — — — — — — — — — — —X1
5.Dedicated differential I/O driving the reference clock of the CCC may cause a functional failure due to a software bug — — — — — — — — — — — — —X1
6.Power-up digest is not supportedX1 —X1 — —X1 — —X1 — —X1 — —
7.Programming of the eNVM must only occur as part of a bitstream containing the FPGA fabric — — — — — — — — — — — — —X1
8.Updating eNVM from the FPGA fabric requires changes in the FREQRNG registerX1X1X1X1X1X1X1X1X1X1X1X1X1 —
9.

SYSCTRL_RESET_STATUS macro is not supported

X1 —X1 — —X1 — — X1 — —X1 — —
10.Zeroization is not supportedX1 —X1 — —X1 — —X1X1 —X1 — —
11.The System Controller RC oscillator runs at 25 MHz after a programming recovery operation — —NS3X1 — — — —NS3X1 — — — —
12.ECC Point-Multiplication service and ECC Point- Addition System service are not supported — — — — — — — —X1 — —X1 — —
13.Programming the FPGA fabric can occur only at room temperature —— — — — — — —X1 — —X1 ——
14.Programming the eNVM blocks needs to occur independent of the fabric —— — — — — — — X1 —— X1— —
15.PCIe Hot Reset support requires a soft reset solution —— X1X1X1X1X1X1X1X1X1X1X1 —
16.eNVM1 becomes inaccessible to FPGA fabric master after executing SRAM-PUF services —— — — — — — — X1X1X1X1X1—
17.After successful completion of 2-step IAP, user design/logic cannot access the fabric SRAM (LSRAM and uSRAM) blocksX1X1X1X1X1X1X1X1X1X1X1X1X1 —
18.SRAM-PUF system services may take two to three seconds to complete — — — — — —— —X1X1X1X1X1 —
19.The I/Os state during programming is changed from Z to weak pull-upX1 —X1— —X1 — — — — —X1 — —
20.For S (security) grade devices, user must not enable write protection for Protected 4 K Regions, also known as Special Sectors in the eNVMX1X1X1X1X1X1X1X1X1X1X1X1X1—
21.Users must not set page lock in eNVM0 for the 060 device and eNVM1 for 090/150 devices — — — — — — —X1X1X1X1X1X1 —
Note:
  1. An “X” means that the Errata exists for that particular device and revision number.
  2. A blank box means that the Errata does not exist or the feature does not exist for that particular device and revision number.
  3. NS (Not Supported) means the Programming Recovery mode is not available in this revision.
  4. Software Errata can be avoided by using Libero®SoC v11.4 SPI or a newer version.