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AVR Microcontroller with Core Independent Peripherals and PicoPower technology ATmega324PB
AVR Microcontroller with Core Independent Peripherals and PicoPower technology ATmega324PB
Product Pages
ATmega324PB
  1. Home
  2. 29 JTAG Interface and On-chip Debug System
  3. 29.5 Using the Boundary-scan Chain

ATmega324PB

  • Introduction
  • Feature
  • 1 Description
  • 2 Configuration Summary
  • 3 Ordering Information
  • 4 Block Diagram
  • 5 Pin Configurations
  • 6 I/O Multiplexing
  • 7 General Information
  • 8 AVR CPU Core
  • 9 AVR Memories
  • 10 System Clock and Clock Options
  • 11 CFD - Clock Failure Detection mechanism
  • 12 PM - Power Management and Sleep Modes
  • 13 SCRST - System Control and Reset
  • 14 INT- Interrupts
  • 15 External Interrupts
  • 16 I/O-Ports
  • 17 TC0 - 8-bit Timer/Counter0 with PWM
  • 18 TC1, 3, 4 - 16-bit Timer/Counter1, 3, 4 with PWM
  • 19 Timer/Counter 0, 1, 3, 4 Prescalers
  • 20 TC2 - 8-bit Timer/Counter2 with PWM and Asynchronous Operation
  • 21 OCM - Output Compare Modulator
  • 22 SPI – Serial Peripheral Interface
  • 23 USART - Universal Synchronous Asynchronous Receiver Transceiver
  • 24 USARTSPI - USART in SPI Mode
  • 25 TWI - 2-wire Serial Interface
  • 26 AC - Analog Comparator
  • 27 ADC - Analog to Digital Converter
  • 28 PTC - Peripheral Touch Controller
  • 29 JTAG Interface and On-chip Debug System
    • 29.1 Features
    • 29.2 Overview
    • 29.3 TAP – Test Access Port
    • 29.4 TAP Controller
    • 29.5 Using the Boundary-scan Chain
    • 29.6 Using the On-chip Debug System
    • 29.7 On-chip Debug Specific JTAG Instructions
    • 29.8 Using the JTAG Programming Capabilities
    • 29.9 Bibliography
    • 29.10 IEEE 1149.1 (JTAG) Boundary-scan
    • 29.11 Data Registers
    • 29.12 Boundry-scan Specific JTAG Instructions
    • 29.13 Boundary-scan Chain
    • 29.14 ATmega324PB Boundary-scan Order
    • 29.15 Boundary-scan Description Language Files
    • 29.16 Register Description
  • 30 BTLDR - Boot Loader Support – Read-While-Write Self-Programming
  • 31 MEMPROG- Memory Programming
  • 32 Electrical Characteristics
  • 33 Typical Characteristics
  • 34 Register Summary
  • 35 Instruction Set Summary
  • 36 Packaging Information
  • 37 Errata
  • 38 Datasheet Revision History
  • The Microchip Web Site
  • Customer Change Notification Service
  • Customer Support
  • Microchip Devices Code Protection Feature
  • Legal Notice
  • Trademarks
  • Quality Management System Certified by DNV
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29.5 Using the Boundary-scan Chain

A complete description of the Boundary-scan capabilities are given in the section IEEE 1149.1 (JTAG) Boundary-scan.

The online versions of the documents are provided as a courtesy. Verify all content and data in the device’s PDF documentation found on the device product page.

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