44.1 Overview

The SRAM Memory Built-In Self-Test module (SMBIST) can be used to test the internal SRAM memory and its associated ECC logic in order to detect potential defects, as part of a global functional safety scheme. The module will run a pass or fail test based on the SMarchCHKBvcd algorithm. During the test process, the SRAM content will be wiped away, so it can only be launched at boot time before anything is stored in the SRAM, such as variables, stacks, etc.

In case one or more defect is found, no information is provided regarding the number and the location of the failing bit(s). It is then up to the user to take action and handle the situation, because even if any number of single bit defects will be corrected by the ECC logic, a unique double bit defect will generate a bus error if the location is later accessed by the application software.