BFM | Boot Flash Memory |
CP | Code Protection |
CRC | Cyclic Redundancy Check |
ECR | EJTAG Control register |
EJTAG | Enhanced Joint Test Action Group |
ETAP | Enhanced Tag Access Port |
ICSP | In-Circuit Serial Programming |
JTAG | Joint Test Action Group |
LSb | Least Significant bit |
MTAP | Microchip Tag Access Port |
MSb | Most Significant bit |
PE | Programming Executive |
PFM | Program Flash Memory |
POR | Power-on Reset |
PWP | Program Write Protection |
SFRs | Special Function Registers |
SPI | Serial Peripheral Interface |
TCK | Test Clock |
TDI | Test Data Input |
TDO | Test Data Output |
TMS | Test Mode Select |
XferData | Transfer Data |
XferFastData | Transfer Fast Data |