| BFM | Boot Flash Memory |
| CP | Code Protection |
| CRC | Cyclic Redundancy Check |
| ECR | EJTAG Control register |
| EJTAG | Enhanced Joint Test Action Group |
| ETAP | Enhanced Tag Access Port |
| ICSP | In-Circuit Serial Programming |
| JTAG | Joint Test Action Group |
| LSb | Least Significant bit |
| MTAP | Microchip Tag Access Port |
| MSb | Most Significant bit |
| PE | Programming Executive |
| PFM | Program Flash Memory |
| POR | Power-on Reset |
| PWP | Program Write Protection |
| SFRs | Special Function Registers |
| SPI | Serial Peripheral Interface |
| TCK | Test Clock |
| TDI | Test Data Input |
| TDO | Test Data Output |
| TMS | Test Mode Select |
| XferData | Transfer Data |
| XferFastData | Transfer Fast Data |