39.2 Absolute Maximum Ratings

Stresses beyond those listed in this section can cause permanent damage to the device. This is a stress rating only. Functional operation of the device at these or other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

Table 39-1. Absolute Maximum Ratings
ParameterConditionRatingUnits
Ambient temperature under bias-40 to +125°C
Maximum junction temperature145°C
Storage temperature-65 to +150°C
Voltage on pins with respect to GND
On the VDD pin -0.3 to +6.5V
On the VDDIO2 pin-0.3 to +6.5V
On the RESET pin-0.3 to (VDD + 0.3)V
On the MVIO pins-0.3 to (VDDIO2 + 0.3)V
On all other pins-0.3 to (VDD + 0.3)V
Maximum current
On the GND pin(1)-40°C ≤ TA ≤ +85°C350 mA
+85°C < TA ≤ +125°C120 mA
On the VDD pin(1)-40°C ≤ TA ≤ +85°C350 mA
+85°C < TA ≤ +125°C120 mA
On the VDDIO2 pin(1)-40°C ≤ TA ≤ +85°C350mA
+85°C < TA ≤ +125°C120 mA
On any standard I/O pin±50 mA
Clamp current, IK (VPIN < 0 or VPIN > VDD)±20 mA
Total power dissipation(2)800 mW
Note:
  1. The maximum current rating requires even load distribution across I/O pins. The device package's power dissipation characterizations may limit the maximum current rating. See Thermal Specifications to calculate device specifications.
  2. Power dissipation is calculated as follows: PDIS = VDD × {IDD - Σ IOH} + Σ {(VDD - VOH) × IOH} + Σ (VOI × IOL)